Article | REF: M4127 V1

Electron diffraction: parallel illumination

Authors: Richard A. PORTIER, Philippe VERMAUT, Bernard JOUFFREY

Publication date: March 10, 2008

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

5. Electron diffraction modes with an incident plane wave

Let's now look at the different diffraction modes used in electron microscopy when the incident beam is prepared as a plane wave. Note that it is neither strictly monochromatic nor strictly parallel. Nevertheless, modern equipment makes it possible to describe diffraction experiments under this illumination condition.

Selected area diffraction
Figure 16...
You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Studies and properties of metals

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Electron diffraction modes with an incident plane wave