Article | REF: TE7650 V1

Fax

Authors: Bernard REVILLET, Gérard BOULAY, Jean-Paul DICK, Jérôme CUDELOU

Publication date: May 10, 2001

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


8. Test patterns and reference documents

8.1 Test patterns

Test patterns are reference images used to qualify the image analyzer or analyzer + printer assembly. They are expensive, as they are produced using a photographic process (offset printing, which translates grays by screening, is not suitable).

To qualify black-and-white scanners, the test patterns feature gradations of gray, alternating white and black bars at various spacings (to measure resolution), centimeter scales (to check compliance with geometry), black lettering on white and gray backgrounds, white lettering on black and gray backgrounds (to assess the necessary contrast), text in several alphabets and of various sizes (to assess readability), continuous-tone photographs...

To qualify color analyzers, test...

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Networks and Telecommunications

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Test patterns and reference documents