Article | REF: R935 V1

Physical approach of EMC testing methods - Analysis of phenomena

Author: Bernard DÉMOULIN

Publication date: June 10, 2017, Review date: January 12, 2022

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1. Physical analysis of measurements and tests

We mentioned in [R 932] that an objective measurement endeavors to situate a variable or a test relative to a reference threshold decreed by a standard. When the device under test exceeds this reference, it fails to comply. Conversely, a device declared compliant may under certain circumstances produce an unacceptable electromagnetic emission, or prove sensitive when exposed to electromagnetic stress of exceptional amplitude. The example given in the box illustrates this context by observing the emission produced in the immediate vicinity of a device in nominal operation....

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Physical analysis of measurements and tests