Français
4. Conducted EMC susceptibility model for CI 555 and MCU 68000
The EMC susceptibility of our circuit depends essentially on the susceptibilities of the active MOSFET components and the two ICs under attack from the sources previously analyzed. Quantifying this susceptibility requires the definition of observable parameters for evaluating the SoF of each component.
4.1 Observable parameter for SI analysis
The observable parameter of our circuit under test is none other than the output quantizables of the active components CI 555 and MCU 68000 during operation. Taking these ICs into account, for this case study we are interested in the Signal Integrity (SI) of the V(M 3 ) and V(M 6 ) outputs. More analytically, the susceptibility of...
The Ultimate Scientific and Technical Reference
This article is included in
Electronics
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Conducted EMC susceptibility model for CI 555 and MCU 68000
EMC, IS and IP simulation of our circuit case study
Bibliography
The Ultimate Scientific and Technical Reference
