4. Conducted EMC susceptibility model for CI 555 and MCU 68000

The EMC susceptibility of our circuit depends essentially on the susceptibilities of the active MOSFET components and the two ICs under attack from the sources previously analyzed. Quantifying this susceptibility requires the definition of observable parameters for evaluating the SoF of each component.

4.1 Observable parameter for SI analysis

The observable parameter of our circuit under test is none other than the output quantizables of the active components CI 555 and CI 68000 during operation. Taking these CIs into account, for this case study we are interested in the Signal Integrity (SI) of the outputs $V (M_{3})$ ...

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Conducted EMC susceptibility model for CI 555 and MCU 68000

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EMC, IS and IP simulation of our circuit case study

Bibliography

(1) - RAVELO (B.), LIU (Y.), JASTRZEBSKI (A.K.) - PCB Near-Field Transient Emission Time-Domain Model, IEEE Transactions on Electromagnetic Compatibility. - Vol. 57, No. 6, p. 1320-1328 (2015).
(2) - XU (Z.), RAVELO (B.), MAURICE (O.), GANTET (J.), MARIER (N.) -...

Standards

Industrial, scientific and medical equipment – Radio interference characteristics – Measurement limits and methods. - IEC CISPR 11 - 2024
Information technology equipment – Radio distortion properties – Test limits and measurement methods. - IEC CISPR 22 - 2019
Electromagnetic compatibility (EMC) – Part 3-2: Limits – Limits for harmonic current emissions (current drawn by devices less than or equal to 16 A per phase)....