Overview
ABSTRACT
This article reviews and presents the basic theoretical and practical aspects of electromagnetic compatibility (EMC). The definitions and descriptions of key electromagnetic interactions are discussed, from near-field to far-field radiation interactions. The fundamental mechanisms underlying the interactions between charged particles and components are described, together with the basic mechanisms that provide an understanding of the noise generated by large-sized digital electronic circuits.
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Olivier MAURICE: Research and Laboratory Director - ESIGELEC – IRSEEM EA4353, Saint-Étienne du Rouvray, France
INTRODUCTION
The purpose of this article is to provide a reminder of fundamental EMC concepts, which can be used in all articles dealing with project EMC. Cross-references are made when concepts are similar to those covered in the Electromagnetism for Engineers course. The focus here is on concepts more specific to the electromagnetic compatibility profession. First, we look at the principles that apply to conducted interactions or close field interactions (electrostatic, magnetostatic interactions). Then we look at guided or radiated wave interactions. A calculation method known as "Kron's method" is presented in paragraph 3, which enables many problems to be calculated quickly and very efficiently. This method will enable any engineer to evaluate already complex EMC problems that would be impossible, or very difficult, to calculate using commercially available tools. As the method is used in various paragraphs as an example and exercise aid, we present it first. Finally, we'll look at the effects of particles on components and the EMC approach to them. It's important to distinguish between the exercise of simulating an EMC problem, using numerical schemes based on meshes and thus creating virtual experiments, and the exercise of theoretically analyzing the problem, based on an engineer's description of the system being treated. The notion of demonstration relates to the agreement between a theoretical prediction and an experiment, whether real or virtual, as long as the schemes used in the virtual experiment are in line with the precision and relevance sought in relation to the real problem and the control we have of its parameters and physical phenomena.
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KEYWORDS
EMC | Kron's method | tensorial analysis of networks
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Electromagnetic compatibility
Bibliography
Websites
Ibis Specifications of the different IBIS standards on http://www.eda.org/ibis/home/specs/specs.htm (page consulted on 10/28/10)
IEC specifications for various standards modeling components (IEC 62433 project), emission measurement methods (IEC 61967) and immunity (IEC 62132) on
Standards and norms
International Electrotechnical Commission IEC http://www.iec.ch/
- EMC IC modelling – Part 1: General modelling framework IEC 62 433-1 47A/840/DTS. - IEC 62433 - (2010)
- Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 1: General conditions and definitions IEC 61967-1 - IEC 61967-1 - (2002-03) ...
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