Article | REF: NM7100 V1

Nanoimagery by near-field optical microscopy

Authors: Paul-Arthur LEMOINE, Yannick DE WILDE

Publication date: October 10, 2007

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ABSTRACT

For over a century, it had been stated for theoretical reasons that the optimal resolution of traditional microscopes was limited to around 250 nm. The near-field optical microscopy now allows for going beyond this limit. Based upon the observation of the light diffracted by the object at only a few nanometers of its surface, this new optics provides access to the behavior of materials in response to an electromagnetic excitation with a resolution of a few nanometers which represents a spectacular technological breakthrough in this domain.

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 INTRODUCTION

For over a century, it was accepted on theoretical grounds that the optimum resolution of conventional microscopes was limited to around 250 nm. Today, near-field optical microscopy makes it possible to break through this barrier. Based on the observation of light diffracted by the object at only a few nanometers from its surface, this new optic gives us access to the behavior of materials in response to electromagnetic excitation with a resolution of just a few nanometers, representing a spectacular technological advance in the field.

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Nano-imaging using near-field optical microscopy