1. Introduction
Since the invention of the transistor and the development of the semiconductor industry, microelectronics has been marked by a race to miniaturize components. This race follows Moore's Law, which predicts that the size of an electronic component decreases by a factor of two every six years. With current advances in lithography techniques, production etch sizes of around 14 nm were reached in 2014 (nanometer ≡ nm for short, 1 nm = 10 -9 m or one billionth of a meter). Components of this size are made up of a countable number of atoms: quantum effects become important and give rise to particular physical properties. The study of the properties of these nano-objects is the field of nanoscience, which has seen spectacular growth worldwide over the last ten years.
The fluorescent semiconductor nanocrystals (quantum dots)...
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
This article is included in
Nanosciences and nanotechnologies
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Introduction
Bibliography
Events
Conference: "NaNaX – Nanoscience with Nanocrystals" takes place every two years in different European countries (even-numbered years).
Conference: "30 years colloidal quantum dots" May 26-28, 2014, Paris.
Directory
Laboratories – Research centers (non-exhaustive list)
Molecular, Organic and Hybrid Electronics Laboratory, INAC-SPrAM (UMR 5819 CEA-CNRS-UJF), CEA Grenoble, 17, rue des Martyrs, 38054 Grenoble cedex 9
( http://inac.cea.fr/spram/NanoX/ )
Laboratoire de physique et d'étude des...
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference