Article | REF: AM5407 V1

Non-destructive testing - Ultrasonic inspection

Author: Christian BUDNIK

Publication date: October 10, 1997

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

4. Defect mapping acquisition

Fault mapping is acquired by signal processing using measurement gates.

The gates measure the transmitted or reflected A-SCAN signal to automatically associate two digital values with each point: a time and an amplitude.

The amplitude measured is either that of the largest signal peak in the gate, or that of the first peak in the gate.

The time measured is the time between ultrasound emission and the appearance of the largest signal peak in the gate, or that of the first peak in the gate (figure 9 ).

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Plastics and composites

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Defect mapping acquisition