Français
4. Conclusion
Microwave dielectric characterization is based on a variety of methods, enabling the measurement to be tailored to the application in question. In the majority of applications, processing the measured quantities is relatively straightforward, and the machine-user interface is relatively simple, requiring no specific expertise in electromagnetics. Most methods require operating powers of no more than a milliwatt, a narrow frequency band and probes operating close to the material. The final advantage lies in the very nature of electromagnetic signals, which offer high measurement sensitivity to the geometric and physical properties of materials, while being non-ionizing.
The Ultimate Scientific and Technical Reference
This article is included in
Electronic measurements and tests
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Conclusion
Glossary
Bibliography
Software tools
Ansys High Frequency Structure Simulator (HFSS) ®
ANSYS France SAS ® (Montigny-le-Bretonneux, France)
Computer Simulation Technology (CST) Studio Suite ®
...
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
Keysight Technologies France SAS ® (Les Ulis, France)
Rohde & Schwarz France SAS ® (Meudon, France)
The Ultimate Scientific and Technical Reference
