Article | REF: R1178 V2

Measurements on optoelectronic emission components

Authors: Irène JOINDOT, Naveena GENAY, Philippe CHANCLOU

Publication date: December 10, 2007

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

2. Electrical measurements

2.1 Static measurements: voltage and current

Measuring the electrical characteristics of semiconductor transmitters is a good first approach to estimating component quality [6].

  • When the emitting diode (LED or sub-threshold laser) is supplied with steady-state power from a DC generator, the total current flowing through the component is composed of :

    • a diffusion current, attributed to radiative recombination (curve I, figure 4 );

    • a non-radiative current, attributed to thermal recombination (or Schottky-Hall-Read) (curve II, figure

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Electronic measurements and tests

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Electrical measurements