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Article | REF: RE274 V1

TOF-SIMS mass spectrometry imaging for the analysis of ancient paintings

Author: Alain BRUNELLE

Publication date: January 10, 2019

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1. Techniques

1.1 TOF-SIMS

There are numerous elemental analysis techniques that can be used to study and characterize the chemical composition of heritage samples. Among these, X-ray fluorescence, Fourier transform infrared spectroscopy, Raman spectroscopy and particle-induced X-ray emission are established and widely used methods (see [RE 200] ,

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