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1. Instrumentation and operating modes
1.1 Microscope
A typical force microscope schematic is shown in figure 1 . A miniature tip, attached to the end of a cantilever, is brought close to the surface of a sample placed on a displacement stage (XYZ scan). The relative displacement of the tip with respect to the sample provides either a map of the measured quantity, or an "isograndeur" surface, if a servo loop adjusts the sample height to keep the measured quantity constant.
the English term cantilever refers to a point suspended in a cantilevered fashion.
The deflection or torsion of the spring under the effect of the interaction...
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Instrumentation and operating modes
Applications
Bibliography
References
Manufacturers, constructors (non-exhaustive list)
Thermal mode microscope
Organizations
French national metrology and testing laboratory (LNE)
Russian Society of Scanning Probe Microscopy and Nanotechnology
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