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3. Preparing samples for individual orientation measurements
The first requirement for electron microscopy is to have samples that are stable in a vacuum and under the impact of high-energy electrons . They must possess a minimum of electrical conductivity so as not to become charged . In the case of TEM, the electrical charge is less critical and can be reduced by placing a thin sample on a conductive support film. Secondary electrons released by a large-aperture diaphragm in the back focal plane will...
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Preparing samples for individual orientation measurements
Conclusion
Bibliography
Sources bibliographiques
Software
EBSD equipment manufacturers provide sophisticated, user-friendly soft-ware for quantitative texture measurement and analysis. In addition, soft-ware packages and toolboxes are available from the following companies:
Further reading
The journal Textures, Stress and Microstructures would give an overview of the development of texture research in the years from 1972 to 2010.
INOUE (H.), TAKAYAMA (Y.) and YOSHINAGA (N.). – 19 th International Conference on Textures of Materials (ICOTOM 19) . IOP Conference Series: Materials Science and Engineering...
Standards
- Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials - ASTM E2627-13 - 2019
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