Article | REF: M3040 V2

Texture and anisotropy of polycrystalline materials Kikuchi diffraction patterns

Authors: Robert SCHWARZER, Claude ESLING

Publication date: December 10, 2021, Review date: January 6, 2023

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2. Measuring individual grain orientation and orientation microscopy

The measurement of individual grain orientations from Kikuchi diagrams works in either transmission or backscatter mode, depending on whether thin sheets or solid materials are being studied. For orientation microscopy, it is essential that the crystal lattice orientations of all grains in the selected area are acquired without user intervention. Automatic mapping is less tedious than interactive measurement, and eliminates subjective grain selection. Orientation microscopy is performed by digitally scanning the primary beam spot on the sample, acquiring the stream of Kikuchi diagrams with a fast digital video camera, and transferring the diagrams to the computer, indexing the diagrams and calculating the crystal lattice orientations of the grains under the beam spot.

2.1 Acquisition...

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Measuring individual grain orientation and orientation microscopy