Overview
ABSTRACT
The short article gives a brief overview of the basics of Kikuchi diffraction, the experimental setup in TEM and SEM, and the preparation of the samples. The diffraction patterns allow to measure the orientation of grains, to study disorientations at grain boundaries, to distinguish different materials and to obtain information on the local perfection of crystals, with a spatial resolution of a few nanometers in transmission (TKD) and of the order of 10 nm in backscattering (BKD, EBSD).
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Read the articleAUTHORS
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Robert SCHWARZER: Retired Professor at the University of Clausthal, Germany
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Claude ESLING: Professor Emeritus, University of Lorraine, France
INTRODUCTION
Many technological materials and natural solids have a polycrystalline, or, at least, a partially crystalline structure. Their properties depend on both the structure of the polycrystalline aggregate and the properties of the individual crystals. The failure of a material is often caused by a heterogeneous microstructure and local defects, in which case knowledge of the overall texture is of very limited use. On the contrary, it is very useful to have high spatial resolution to determine local orientations, to know about orientation gradients within grains and disorientations between grains, and also to have access to some characteristic parameters of grain boundaries.
Developments in electron diffraction are detailed, with emphasis on current methods particularly relevant to texture analysis in materials science. Since 2000, numerous applications have been published in fields such as metallurgy and materials science, structural geology and biomineralization, which cannot be presented in detail in this article. Experimental set-ups are briefly discussed. Limitations due to spatial resolution and grain size are discussed. The crystal volume that contributes to a Kikuchi pattern is only 0.1 μm 3 . The preparation of clean, reasonably flat surfaces, free of foreign coatings, by metallographic polishing and ion milling is therefore particularly important, but often difficult.
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KEYWORDS
EBSD | TKD | IBP | orientation microscopy
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Studies and properties of metals
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Texture and anisotropy of polycrystalline materials
Bibliography
Sources bibliographiques
Software
EBSD equipment manufacturers provide sophisticated, user-friendly soft-ware for quantitative texture measurement and analysis. In addition, soft-ware packages and toolboxes are available from the following companies:
Further reading
The journal Textures, Stress and Microstructures would give an overview of the development of texture research in the years from 1972 to 2010.
INOUE (H.), TAKAYAMA (Y.) and YOSHINAGA (N.). – 19 th International Conference on Textures of Materials (ICOTOM 19) . IOP Conference Series: Materials Science and Engineering...
Standards
- Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials - ASTM E2627-13 - 2019
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