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ABSTRACT
X-ray tomography offers a non-destructive 3D view of the microstructure of materials (distribution of internal phases) with a resolution of the order of the micron. Coupling the technique with loading of the sample also permits a fine characterization of the deformation and transformation mechanisms at play. This article describes the technological components necessary for setting up an X-ray tomography device. It then gives several examples of experiments where in situ X-ray tomography has been used in recent years to solve materials science problems.
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Read the articleAUTHORS
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Eric MAIRE: CNRS Research Director, University of Lyon, - Materials Laboratory – Engineering and Sciences (MATEIS) – UMR CNRS 5510, INSA Lyon, Villeurbanne, France
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Pierre LHUISSIER: CNRS research fellow, - Materials and Processes Science and Engineering Laboratory (SIMaP) – UMR CNRS 5266, Université Grenoble Alpes, Saint-Martin-d'Hères, France
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Luc SALVO: University Professor at Grenoble INP, - Materials and Processes Science and Engineering Laboratory (SIMaP) – UMR CNRS 5266, Université Grenoble Alpes, Saint-Martin-d'Hères, France
INTRODUCTION
X-ray tomography involves combining a number of X-ray images taken from different angles, to produce a three-dimensional reconstruction of the distribution of the X-ray absorption coefficient. This technique generates a digital volume of the distribution of the various phases (in the sense of their chemical composition) present in the observed sample.
In materials science, tomography enables us to characterize the distribution, morphology (shape, size, etc.) and topology (connectivity, percolation, etc.) of the phases present in 3D, with spatial resolution in the micrometer range. The use of this technique simultaneously with a stress (thermal, mechanical, hydric, etc.) on the material, known as in situ characterization, gives access to the evolution of these parameters during the stress.
The wealth of information contained in these 3D images, as well as the non-destructive aspect of the technique, make tomography the characterization method of choice in a number of materials science issues. In-situ tomography, for example, has proved its worth in characterizing damage under both room-temperature and hot-stress conditions, and in monitoring phase transformations.
The main principles of X-ray tomography are described in the article
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KEYWORDS
materials science | tomography | X-rays | X-ray tomography | in situ tests | damaging | solidification
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