Article | REF: M4134 V1

Study of metals by transmission electron microscopy (TEM) - Microscope, samples and diffraction

Authors: Miroslav KARLÍK, Bernard JOUFFREY

Publication date: June 10, 2008

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

3. Diffraction

Compared with other diffraction techniques (X-ray and neutron), electron diffraction enables structural analysis on a microscopic scale, in correlation with the image. Diffraction patterns are a rich source of information on the crystallographic structure of metals and their defects. Depending on requirements, several diffraction modes can be employed, differing in the size of the illuminated zone and the angle of convergence of the incident beam. Theoretical bases in this field can be found elsewhere [M 4 126] .

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Studies and properties of metals

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Diffraction