5. Conclusion
Thanks to the development of Surfs, a new generation of microscope slides, optical microscopy, which since its invention several centuries ago has been confined to the observation of microscopic or submicroscopic structures, has now been propelled into the field of nanotechnology, which until now has been reserved for characterization techniques using electron sources (SEM, TEM, etc.) or near-field sources (AFM, STM, etc.). In addition to their accessibility, optical microscopes offer several advantages over conventional nanometric characterization techniques: analysis in real time, in aqueous media, in controlled atmospheres, wide choice of magnification...
These features have enabled the SEEC technique to gradually establish itself as an essential technique for characterizing nanofilms, nanotubes and nano-objects, despite the imposed support and limited lateral...
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
This article is included in
Optics and photonics
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Conclusion
Bibliography
Patents
Anti-reflective mounts and contrast-amplifying mounts for polarized reflection light [FR 2 841 339 A1].
Two-dimensional ellipsometric sample display device, display method and spatially resolved ellipsometric measurement method [FR 2 818 376 A1].
Directory
Marketing of optical contrast amplifier media :Nanolane-France http://www.nano-lane.com
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference