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Jean-Marie DORKEL: Doctor of Science - Professor at the Institut national des sciences appliquées de Toulouse - Researcher at LAAS/CNRS, Toulouse
INTRODUCTION
Analytical and other methods for assessing the temperature of the active zone, or junction temperature, of a power semiconductor component are the subject of a first article. .
In this article, we will address the problem of the interactivity between the power dissipated by the component and its temperature with a view to discussing the validity of the junction temperature concept, and we will conclude our presentation with some considerations on the induced problems of thermal fatigue and reliability.
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Power semiconductors
Electrothermal couplings in power components
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