Article | REF: NM7050 V1

The metrological atomic force microscope

Authors: Sébastien DUCOURTIEUX, Benoît POYET

Publication date: August 10, 2013

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4. Metrological atomic force microscope

At the nanometer scale, the metrological atomic force microscope is the means of connecting dimensional measurements to the International System of Units. It acts as a link between the users of near-field microscopes at the base of the traceability pyramid and the unit of length at the top of the pyramid. It is a measuring instrument dedicated to the calibration of transfer standards used in the field of nanoscience and nanotechnology.

4.1 Definition

A metrological atomic force microscope (mAFM) differs from a traditional AFM (same operating principle)

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Metrological atomic force microscope