4. Characterization of LPE-epitaxial thin films
The physico-chemical characterizations that need to be carried out on thin films produced by LPE depend on the intended applications. Nevertheless, a number of them can be carried out systematically, in order to qualify the samples.
4.1 Microstructural characterization by microscopy
The first important characterization is to observe the sample under optical microscopy, in order to confirm whether or not an epitaxial layer is present and, if so, to measure its thickness, as well as to report qualitatively on its general appearance: presence of cracks, state of the layer/substrate interface, presence of bubbles or inclusions, homogeneity of the layer and its thickness. Figure 11...
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Characterization of LPE-epitaxial thin films
Bibliography
Websites
CNRS CMDO+ network (Micro-nanostructured crystals and devices for optics) http://cmdo.cnrs.fr/
CNRS CRISTECH network http://www.cristech.cnrs.fr
Events
National Crystal Days for Optics (JNCO-Formation): National CNRS training event organized through the CNRS CMDO+ network. http://cmdo.cnrs.fr/
Journées nationales des cristaux pour l'optique (JNCO-SFO): National conference organized by the Crystals for Optics Club of the Société française d'optique.
Directory
Laboratories and research centers working on the growth and structuring of thin crystalline layers by liquid-phase epitaxy
Center de recherche sur les ions, les matériaux et la photonique (CIMAP) – OML "Optique-Matériaux-Laser" group http://www.cimap.ensicaen.fr
European Synchrotron radiation Facilities...
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