Article | REF: E6308 V1

Crystalline thin films Elaboration processes and applications

Authors: Gurvan BRASSE, Patrice CAMY

Publication date: October 10, 2018

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

4. Characterization of LPE-epitaxial thin films

The physico-chemical characterizations that need to be carried out on thin films produced by LPE depend on the intended applications. Nevertheless, a number of them can be carried out systematically, in order to qualify the samples.

4.1 Microstructural characterization by microscopy

The first important characterization is to observe the sample under optical microscopy, in order to confirm whether or not an epitaxial layer is present and, if so, to measure its thickness, as well as to report qualitatively on its general appearance: presence of cracks, state of the layer/substrate interface, presence of bubbles or inclusions, homogeneity of the layer and its thickness. Figure 11...

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Nanosciences and nanotechnologies

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Characterization of LPE-epitaxial thin films
Outline