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1. Interactions between organic matter and electron beams
The two main types of microscope discussed here are the transmission electron microscope (TEM) and the scanning electron microscope (SEM).
In theMET , the image is formed by interactions between the sample and a large beam of electrons passing through it (figure 1 a ). It is then magnified by a system of electromagnetic lenses. Maximum separating power is of the order of 0.2 to 0.3 nm for modern medium-voltage TEMs (200 to 400 kV). Some TEMs also operate in scanning electron transmission microscopy (STEM) mode, with a very fine probe, which is useful, for example, if you want to combine morphology with spectroscopic analysis of the X-rays (RX) emitted during irradiation.
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Interactions between organic matter and electron beams
Contrast mechanisms
References
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Manufacturers – Suppliers – Distributors (non-exhaustive list)
BAL-TEC AG http://www.bal-tec.com
DIATOME Ltd. http://www.diatome.ch
Electron microscopy sciences http://www.emsdiasum.com/
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Materials Studio (Modeling and simulation for R&D chemicals and materials). ACCELRYS SOFTWARE Inc. http://www.accelrys.com/
EMS (Simulation of images and diffraction patterns, partly accessible via the Internet)
CRISP (crystallographic image processing, diffraction pattern analysis) CALIDRIS
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