Article | REF: P3860 V4

Trace and ultra-trace elements analysis

Authors: Linda AYOUNI-DEROUICHE, Frédérique BESSUEILLE-BARBIER, Nicole GILON, Agnès HAGÈGE

Publication date: December 10, 2021

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3. Specific issues in trace analysis

3.1 Imaging

Localized analysis of an element and its distribution on the surface of a material is becoming increasingly popular in all fields. This type of analysis (figure 1 ) requires an elemental trace analysis, since depending on the size of the measuring pixel (2D), the element content to be measured can be extremely low. Most of the multi-element techniques mentioned above enable imaging analysis, to which surface analysis techniques can be added. Several fields of application are driving analytical developments

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Specific issues in trace analysis