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  5. Characterization of defects

Article | REF: M4145 V1

Electron Channelling Contrast Imaging Technique (ECCI) and crystalline defects

Author: Nabila MALOUFI

Publication date: December 10, 2021

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4. Characterization of defects

4.1 Image of a dislocation (contrast optimization)

Channelling is achieved for a family of hkl planes when the untilted incident beam falls on the edge of the band (hkl), ideally for s > 0 and far from the intersection of another band edge so that only one diffraction condition is satisfied .

Dislocation images often have a bright side and a dark side (figure

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Characterization of defects
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