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Article | REF: BE8581 V1

Potential Induced Degradation PID

Author: Benjamin FRITZ

Publication date: January 10, 2021, Review date: February 4, 2021

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3. PID characterization methods

3.1 System level (outdoor)

Although photovoltaic panels are designed for reliable, long-lasting operation over their entire lifetime, failures still occur. Figure 11 shows us different failures, depending on the lifetime of the product, in which the PID is classified as a half-life failure.

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PID characterization methods
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