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4. SEEC microscopy
4.1 Principle
In the early 2000s, a study conducted by Ausserré and Valignat on the modeling of the light path in polarized light has led to the development of new supports meeting contrast amplification conditions for optical microscopy between crossed polarizers. Existing anti-reflective surfaces are designed for unpolarized light and observation at normal incidence. They are therefore unsuitable for microscope observations under convergent...
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SEEC microscopy
Conclusion
Bibliography
Patents
Anti-reflective mounts and contrast-amplifying mounts for polarized reflection light [FR 2 841 339 A1].
Two-dimensional ellipsometric sample display device, display method and spatially resolved ellipsometric measurement method [FR 2 818 376 A1].
Directory
Marketing of optical contrast amplifier media :Nanolane-France http://www.nano-lane.com
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