![](/assets/images/picto-drapeau-france-3a76576a5d60a512053b4612ab58dae5.png)
4. SEEC microscopy
4.1 Principle
In the early 2000s, a study conducted by Ausserré and Valignat on the modeling of the light path in polarized light has led to the development of new supports meeting contrast amplification conditions for optical microscopy between crossed polarizers. Existing anti-reflective surfaces are designed for unpolarized light and observation at normal incidence. They are therefore unsuitable for microscope observations under convergent...
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
![](/assets/images/logo-eti-286623ed91fa802ce039246e516e5852.png)
The Ultimate Scientific and Technical Reference
This article is included in
Nanosciences and nanotechnologies
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
SEEC microscopy
Bibliography
Patents
Anti-reflective mounts and contrast-amplifying mounts for polarized reflection light [FR 2 841 339 A1].
Two-dimensional ellipsometric sample display device, display method and spatially resolved ellipsometric measurement method [FR 2 818 376 A1].
Directory
Marketing of optical contrast amplifier media :Nanolane-France http://www.nano-lane.com
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
![](/assets/images/logo-eti-286623ed91fa802ce039246e516e5852.png)
The Ultimate Scientific and Technical Reference