Article | REF: NM7500 V1

Surface Enhanced Ellipsomteric Contrast (SEEC) microscopy : optical microscopy as a means of nanoscale characterization

Authors: Nicolas MEDARD, Marie-Pierre VALIGNAT

Publication date: October 10, 2011

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

4. SEEC microscopy

4.1 Principle

In the early 2000s, a study conducted by Ausserré and Valignat on the modeling of the light path in polarized light has led to the development of new supports meeting contrast amplification conditions for optical microscopy between crossed polarizers. Existing anti-reflective surfaces are designed for unpolarized light and observation at normal incidence. They are therefore unsuitable for microscope observations under convergent...

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Nanosciences and nanotechnologies

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
SEEC microscopy