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3. Atomic force microscopy and force microscopy
The Atomic Force Microscope (AFM) was born in 1986 from the need to image all types of samples, not just conductors and semi-conductors, by probing forces between tip and surface . By measuring and controlling these forces, a suitable microscope should be able to image surface topography and also study other physical phenomena on the nanometric scale. The AFM, based on this objective, borrows from STM technology the system of nanometric displacements and regulation of relative tip-surface displacement at constant force (in place of current for the STM). The setpoint is the force applied by the fine tip to the scanned surface.
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Atomic force microscopy and force microscopy
Near-field optical microscope
Bibliography
Bibliography
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
Calculate the stiffness of a lever : https://sadermethod.org/
From the same authors :
BUY an AFM – Photoniques 90 (2018). A list of microscope manufacturers and tip manufacturers/distributors is available.
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