Article | REF: IN224 V1

AFM-IR : a tool to explore the matter at the nanoscale

Authors: Alexandre DAZZI, Ariane DENISET-BESSEAU

Publication date: July 10, 2019

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

4. Outlook and developments

Over the last ten years, AFM-IR technology has made constant progress, both in terms of technology (instrument performance and capabilities) and potential applications in controlled environments (dry air, constant gas pressure). From an instrumental point of view, the greatest advances over the last 2 years have been: i) the development of chemical imaging using the oscillating mode (AFM tapping) to study small, fragile objects with poor surface adhesion, and ii) the possibility of polarization-resolved measurements...

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Nanosciences and nanotechnologies

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Outlook and developments