4. Static probabilistic calculations
4.1 General considerations on probabilistic calculations
Figure 10 uses Venn diagrams to illustrate the main concepts for manipulating events:
certain event: Ω. It represents the union of all events that can occur;
event A: part of Ω ;
event complementary to A in Ω. So ...
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
This article is included in
Safety and risk management
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Static probabilistic calculations
Bibliography
Software tools
GRIF-Workshop software package (GRaphique Interactif pour la Fiabilité), developed by ELF and then for TOTAL by SATODEV
– BFIAB module: reliability diagrams
– Module Tree: fault trees
– ETree module: event trees
– SIL module: BDF adapted to functional safety
– Petri module: stochastic Petri nets...
Websites
GRIF-Workshop: Demo versions downloadable at http://grif-workshop.fr
Standards and norms
- Diagrammes de fiabilité - CEI (IEC) CEI 61078 - 2016
- International electrotechnical vocabulary – Part 192: Dependability - CEI (IEC) IEC 60050-192 (IEV 192) - 2015
- Expressions mathématiques pour les termes de fiabilité, de disponibilité, de maintenabilité et de logistique de maintenance - CEI (IEC) CEI 61703 - 2016
- Petroleum, petrochemical and natural gas industries – Reliability modelling and...
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
GRIF-Workshop software package. SATODEV (SAfety TOols DEVelopment) http://www.satodev.com
Organizations – Federations – Associations (non-exhaustive list)
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference