Article | REF: SF1500 V1

Automatic defect detection in tomographic volumes using artificial intelligence approaches

Authors: Valérie KAFTANDJIAN, Abdel Rahman DAKAK, Philippe DUVAUCHELLE

Publication date: September 10, 2022

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2. Description of the processing chain

The process of processing data from tomographic slices comprises several stages summarized in figure 1 :

Summary of the overall detection chain and classification of indications into true faults / false alarms
Figure...
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Description of the processing chain